巨政权, 郑见灵, 满梦华. 三模冗余演化自修复系统设计及可靠性分析[J]. 微电子学与计算机, 2012, 29(5): 29-33.
引用本文: 巨政权, 郑见灵, 满梦华. 三模冗余演化自修复系统设计及可靠性分析[J]. 微电子学与计算机, 2012, 29(5): 29-33.
JU Zheng-quan, ZHENG Jian-ling, MAN Meng-hua. Designed and Reliability Analysis of Triple Module Redundancy System with Evolvable Self-repairing[J]. Microelectronics & Computer, 2012, 29(5): 29-33.
Citation: JU Zheng-quan, ZHENG Jian-ling, MAN Meng-hua. Designed and Reliability Analysis of Triple Module Redundancy System with Evolvable Self-repairing[J]. Microelectronics & Computer, 2012, 29(5): 29-33.

三模冗余演化自修复系统设计及可靠性分析

Designed and Reliability Analysis of Triple Module Redundancy System with Evolvable Self-repairing

  • 摘要: 将演化硬件与TMR技术相结合在系统级层面设计并实现了一款ETMR系统,并以马尔可夫过程理论为基础探讨了其可靠性规律.发现在任意区间上,ETMR较之单模和TMR系统具有较高可靠性,同时指出修复率与故障率比值是影响ETMR系统可靠度的主要因素,且比值越大其可靠度接近于1的区间跨度越大.系统构建方法及所得结论对于将ETMR系统应用于具体工程实践具有一定的启发和指导作用.

     

    Abstract: Designed and realized an ETMR system based on EHW and TMR technologies, and analyzed its reliability with Markov's course theory. We found that ETMR system has higher reliability compared with the single mould and TMR system in any times, and the main factor of influence the ETRM system reliability was the ratio of repair rate and failure rate, further, the larger the ratio is, the bigger the interval span that its reliability approach 1 is. This method and conclusions has certain inspiration and guidance in applying ETMR system to the concrete project practice.

     

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