胡燕京, 张毅坤, 朱伟, 于全喜. 嵌入式软件功能路径测试用例自动生成研究[J]. 微电子学与计算机, 2010, 27(1): 81-85.
引用本文: 胡燕京, 张毅坤, 朱伟, 于全喜. 嵌入式软件功能路径测试用例自动生成研究[J]. 微电子学与计算机, 2010, 27(1): 81-85.
HU Yan-jing, ZHANG Yi-kun, ZHU Wei, YU Quan-xi. Research on Automate Generation Method Embedded Software Function-path Test Cases[J]. Microelectronics & Computer, 2010, 27(1): 81-85.
Citation: HU Yan-jing, ZHANG Yi-kun, ZHU Wei, YU Quan-xi. Research on Automate Generation Method Embedded Software Function-path Test Cases[J]. Microelectronics & Computer, 2010, 27(1): 81-85.

嵌入式软件功能路径测试用例自动生成研究

Research on Automate Generation Method Embedded Software Function-path Test Cases

  • 摘要: 根据嵌入式软件的结构特点尝试了一种适合于嵌入式软件测试实际的功能路径测试方法.通过分析功能路径上的结点谓词和功能约束条件, 用一种简洁、快速的算法建立和求解输入变量的约束系统, 生成功能路径测试用例.实践证明, 该测试用例可同时测试嵌入式软件的功能和结构, 测试效率高、生成代价低且测试较为全面, 能有效降低嵌入式软件开发、测试和维护的成本.

     

    Abstract: According to the structural characteristics of embedded software, this paper try to fit a practical function-path method of embedded software testing.By analyzing the node predicates and function constraints on the function paths, the author use a simple, fast algorithm to build up and solute a restraint system of input variables, generating function-path test cases.Practice has proved that the test cases can test the functions and structures of embedded software at the same time.The high-efficiency, low price and more comprehensive of the test cases can lower the costs of the development, testing and maintenance of embedded software.

     

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