“龙腾”S2微处理器测试结构设计
Test Structure Design of "Longtium" S2 Micro-Processor
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摘要: 介绍了“龙腾”S2微处理器测试结构设计方法, 详细讨论了采用全扫描测试、内建自测试 (BIST) 等可测性设计 (DFT) 技术.该处理器与PC104全兼容, 设计中的所有寄存器采用全扫描结构, 设计中的存储器采用内建自测试, 整个设计使用JTAG作为测试接口.通过这些可测性设计, 使芯片的故障覆盖率达到了100%, 能够满足流片后测试需求.Abstract: This paper presents the test architecture of "Longtium" S2 micro-processor, adopted full scan test, Built-In Self Test (BIST) etc.Design For Test (DFT) .The processor is full compatible with PC104, In our design, all registers was structured by full scan, all memories were applied with BIST, whole design used JTAG for test interface.All those made faults coverage of the chip to come to 100%.
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