汽车电子MCU的抗EMI设计与测试方案
Anti-EMI Design and Test Scheme for Automotive MCU
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摘要: 针对汽车电子MCU的电磁兼容设计，提出了一些可行性的方法，主要包括时钟以及IO端口的设计，并且根据芯片级测试标准IEC61967的传导发射测试——1Ω/150Ω直接耦合法，进行适合汽车电子MCU的电磁干扰测试.经过样本数据的分析发现，芯片级电磁干扰与时钟频率、功能模块类别以及工作模式等有着密切的关系.Abstract: Proposing some effective methods for electromagnetic capability of Automotive MCU,including clock and IO port design.According to conducted emissions test of IEC 61967——1Ω/150Ω direct coupling method for electromagnetic interference,a test suitable for Automotive MCU is done in the paper.From analysis result of sample data,electromagnetic interference of chip level has close relationship with clock,characteristics of function module and operation mode.
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