Abstract: This paper presents the design of a mixed-signal device interface board based on the bisection method.The board can be programmed freely to finish both the analog and digital pins lossless reconfiguration of the devices under test with the testing system.And it is widely used in the field of IC automatic test.The bisection method is used to classify the pins which have different functions.And one-to-one mapping of the pins is achieved by bubble sorting algorithm.Using the analog switching arrays as channels, both the analog and digital signals can pass freely.The complex digital connection is accomplished in the FPGA, which can provide enough programmable gate arrays.This design achieved complex mixed-signal channel reconfiguration with a few switches.Besides high resource utilization, the difficulty and cost of chip test have been reduced greatly.