张庆伟, 温廷敦. 轴向应变对双势垒结构共振隧穿的影响[J]. 微电子学与计算机, 2010, 27(5): 199-201.
引用本文: 张庆伟, 温廷敦. 轴向应变对双势垒结构共振隧穿的影响[J]. 微电子学与计算机, 2010, 27(5): 199-201.
ZHANG Qing-wei, WEN Ting-dun. The Influence of Axial Strain on Double-Barrier Resonant Tunneling[J]. Microelectronics & Computer, 2010, 27(5): 199-201.
Citation: ZHANG Qing-wei, WEN Ting-dun. The Influence of Axial Strain on Double-Barrier Resonant Tunneling[J]. Microelectronics & Computer, 2010, 27(5): 199-201.

轴向应变对双势垒结构共振隧穿的影响

The Influence of Axial Strain on Double-Barrier Resonant Tunneling

  • 摘要: 首先介绍了共振隧穿理论和一种新效应——介观压阻效应,对AlxGa1_xAs/GaAl/AlxGa1_xAs共振隧穿双势垒结构的轴向施加压应变作了分析,然后计算了轴向应变对垒宽和垒高的影响,对透射系数和隧穿电流用Matlab作了仿真.发现压应变可以使隧穿电流线性增加,偏压不同电流增加的速率也不同,为设计共振隧穿器件提供了理论依据.

     

    Abstract: This paper firstly introduced a new effect,meso-piezoresistive effect,analysed the strain on AlxGa1_xAs/GaAl/AlxGa1_xAs double-barrier resonant tunneling structure along the axis director; then computed the influence of the barrier width and height from the axial strain,used Matlab as tool simulate the transmission coefficient and tunneling electric current. Finally we find the strain can make the electric current increase linearly,the velocity of increase differ with different voltage. It offers a theory basis for devising resonant tunneling devices.

     

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