Abstract: In this paper, we propose a new detecting technology which combines the dynamic current-static current detecting approach in the test phase with inserting the scan-chain in the design phase. Choosing the Can Bus controller circuit as the circuit under test(CUT), inserting the scan-chain in the design phase and tape it out. Then design specified PCB test board, choose the SourceMeter and Can transceivers to set up the test system. The test result shows that this system can reduce the influence of the process variation on the detecting result efficiently and improve the detection accuracy.