张峻宾, 蔡金燕, 孟亚峰, 许杰, 孙也尊. 基于EHW和双机热备技术的故障自修复电路系统设计[J]. 微电子学与计算机, 2016, 33(5): 124-126, 132.
引用本文: 张峻宾, 蔡金燕, 孟亚峰, 许杰, 孙也尊. 基于EHW和双机热备技术的故障自修复电路系统设计[J]. 微电子学与计算机, 2016, 33(5): 124-126, 132.
ZHANG Jun-bin, CAI Jin-yan, MENG Ya-feng, XU Jie, SUN Ye-zun. Design of the Fault Self-repair Circuit System Based on Evolvable Hardware and Dual Hot-backup Technique[J]. Microelectronics & Computer, 2016, 33(5): 124-126, 132.
Citation: ZHANG Jun-bin, CAI Jin-yan, MENG Ya-feng, XU Jie, SUN Ye-zun. Design of the Fault Self-repair Circuit System Based on Evolvable Hardware and Dual Hot-backup Technique[J]. Microelectronics & Computer, 2016, 33(5): 124-126, 132.

基于EHW和双机热备技术的故障自修复电路系统设计

Design of the Fault Self-repair Circuit System Based on Evolvable Hardware and Dual Hot-backup Technique

  • 摘要: 在充分利用EHW技术的自组织、自适应及自修复优点的基础之上, 权衡传统冗余容错技术的可靠性和硬件资源消耗等指标, 提出了EHW与双机热备技术相结合的故障自修复电路系统.对电路系统的模型进行了设计, 对故障自修复流程进行了深入分析.基于EHW和双机热备技术的故障自修复电路系统具有重要的工程应用价值.

     

    Abstract: In this paper, the circuit system design based on Evolvable Hardware (EHW) and dual hot-backup technique was proposed. It made full use of the advantages of EHW. Both the reliability of traditional redundant fault-tolerant and hardware resource consumption was considered. The universal circuit model based on EHW and dual hot-backup technique was designed. The flow of fault self-repair was analyzed in detail. The fault self-repair circuit system design can be guided by it. It will have important engineering application value.

     

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