聂廷远, 高久顼, 王培培. VLSI电路的复杂网络特性研究[J]. 微电子学与计算机, 2017, 34(8): 133-136.
引用本文: 聂廷远, 高久顼, 王培培. VLSI电路的复杂网络特性研究[J]. 微电子学与计算机, 2017, 34(8): 133-136.
NIE Ting-yuan, GAO Jiu-xu, WANG Pei-pei. The Research of VLSI Circuit Complex Network Property[J]. Microelectronics & Computer, 2017, 34(8): 133-136.
Citation: NIE Ting-yuan, GAO Jiu-xu, WANG Pei-pei. The Research of VLSI Circuit Complex Network Property[J]. Microelectronics & Computer, 2017, 34(8): 133-136.

VLSI电路的复杂网络特性研究

The Research of VLSI Circuit Complex Network Property

  • 摘要: 针对电路集成快速发展所带来的电路集成密度大、结构复杂的问题,基于IBM-HB+Benchmark研究集成电路的复杂网络特性.实验结果表明,IBM-HB+Benchmark网络的累积度分布满足高斯分布,属于单一规模网络;IBM-HB+Benchmark网络同样具有小世界特性,其平均集聚系数是同等规模随机网络的28.51倍.

     

    Abstract: The VLSI (Very Large-Scale Integration) circuit is becoming complicated and dense than ever before due to the rapid development. In the paper, we study the complex network characteristics of the integrated circuits based on IBM-HB+ Benchmark suits.The experimental results show that the cumulative degree distribution of IBM-HB + Benchmark follows Gaussian distribution which indicates the network belongs to single-scale network. In the same time, the networkhas a small-world property because its clustering coefficient is averagely 28.51 times of the same scale random network.

     

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