胡玉松, 冯全源, 陈晓培. 一款600V VDMOS终端结构的设计[J]. 微电子学与计算机, 2014, 31(6): 129-132.
引用本文: 胡玉松, 冯全源, 陈晓培. 一款600V VDMOS终端结构的设计[J]. 微电子学与计算机, 2014, 31(6): 129-132.
HU Yu-song, FENG Quan-yuan, CHEN Xiao-pei. Design of a 600 V VDMOS Termination Structure[J]. Microelectronics & Computer, 2014, 31(6): 129-132.
Citation: HU Yu-song, FENG Quan-yuan, CHEN Xiao-pei. Design of a 600 V VDMOS Termination Structure[J]. Microelectronics & Computer, 2014, 31(6): 129-132.

一款600V VDMOS终端结构的设计

Design of a 600 V VDMOS Termination Structure

  • 摘要: 设计了一款600 V VDMOS功率器件的终端保护环结构,采用场限环与复合场板相结合的方式降低硅表面的电场峰值,且表面电场分布均匀.在159 μm终端长度上仿真实现了670 V的耐压,表面电场最大值为2.36e5 V*cm-1,提高了终端的可靠性;工艺简单,同时没有增加额外的掩膜与步骤.

     

    Abstract: The termination structure of 600 V VDMOS has been designed, which consists of the field limit ring and the complex filed plate to reduce the peak of the electric field and make it flat at the silicon surface. By the simulation, the breakdown-voltage 670 V has been achieved with 159 μm length termination structure, and the termination's reliability has been improved owing to 2.36e5 V*cm-1 of the maximum surface electric-field. The process technology of this device is simple without additional masks and steps.

     

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