Quasi-Three-Dimensional Simulation of MNU in SEU Hardened Storage Cells

We study the interplay of the charge collection and voltage change of multiple-node upset in SEU hardened cell,using the quasi-3D device/ circuit mixed-mode simulation in a DICE cell. The results show the transient floating node and charge lateral diffusion are the key reasons for MNU. We also compare the MNU in other SEU hardened cells,and discuss the methods to avoid MNU.