A New Static Test Method of a DAC with a Built-In Structure

A new BIST (Built-In Self-Test) method to test static parameters of a DAC (Digital to Analog Converter) is proposed in this paper.The BIST method employs a ramp generator and two voltage references to test static parameters of a DAC:offset error,gain error,INL (Integral Non-Linearity) and DNL (Differential Non-Linearity).The optimization of calculating static parameters and the components sharing can reduce the BIST circuitry.The simulation result shows that the method is able to detect the static errors with the simple BIST structure.