Optimization of SoC Test Multiple Objects Based on TAM Grouping Strategy

In the study of System-on-Chip (SoC) test optimization technology,test time and test power were mutual influence and restrict to each other. Based on TAM grouping strategy, this paper constructed the combined optimization model for test time and test power,applied multi-objective genetic algorithm to deal with the combined optimization model,and adopted ITC'02 Benchmark circuit p93791 to verify the algorithm.The results show that it can obtain ideal solutions on optimization of test time and test power,and improve the utilization of TAM.