WU Le, LIU Wu, HONG Liang. Investigation on disturbance characteristics and test algorithm of SONOS embedded flash memory[J]. Microelectronics & Computer, 2021, 38(5): 7-13.
Citation: WU Le, LIU Wu, HONG Liang. Investigation on disturbance characteristics and test algorithm of SONOS embedded flash memory[J]. Microelectronics & Computer, 2021, 38(5): 7-13.

Investigation on disturbance characteristics and test algorithm of SONOS embedded flash memory

  • The current Flash disturbance failure test algorithm cannot detect all the disturbance failures of SONOS-type Flash memory, especially the failure coverage of read disturbance failure test is low, and the test efficiency is poor. To solve this problem, this paper extends and optimises the March-FT test algorithm, and put forward the March-SONOS test algorithm, which is used to detect the disturbance failure test algorithm of SONOS-type Flash memory.Combined with the verification of the algorithm evaluation system, the March_SONOS test algorithm can detect all disturbance failures of SONOS-style Flash memory, and the failure coverage rate reaches 100%. Meanwhile, the algorithm test and test efficiency is improved by 55.97%.
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