Soft error sensitivity estimation of single event multi-transient induced combination circuits

In order to evaluate the soft error sensitivity of digital circuits, a single event multi-transient (SEMT) induced soft error analysis system for combinational circuits based on FPGA is proposed. Considering the influence of electrical shielding and the randomness of incident radiation particles in the process of pulse transmission, we control the different pulse width of the SEMT pulse to inject all the fault locations of the SEMT, and statistics the error results. The experimental results show that the system can analyze the soft error sensitivity of two or more transient induced combinational circuits. The sensitivity information of each fault location can be obtained, and the front-end of power supply circuit design can be improved.