Research on Single Event Transient of Digital to Analog Converter

This paper mainly studies. single event transient (SET) of a digital to analog converter produced in China. The tested device in the paper was irradiated with different particles, and the output of the DUT was connected to an oscilloscope. If a SET occurs, the oscilloscope would capture it and save its data. The test results show that with increasing LET of particles, the SET is more obvious, the times of SET is larger and the pulse width of SET becomes wider.