YAN Zhe, ZHANG Hong, JIE Bai-rui, RUAN Ai-wu. Research on Bitstream Readback-based Test Method for Mbedded BRAM in VirtexⅡ[J]. Microelectronics & Computer, 2016, 33(5): 58-61.
Citation: YAN Zhe, ZHANG Hong, JIE Bai-rui, RUAN Ai-wu. Research on Bitstream Readback-based Test Method for Mbedded BRAM in VirtexⅡ[J]. Microelectronics & Computer, 2016, 33(5): 58-61.

Research on Bitstream Readback-based Test Method for Mbedded BRAM in VirtexⅡ

  • This paper mainly presents a bitstream readback-based test method for embedded BRAM in VirtexⅡ, which based on the independent research of FPGA test platform. The test system can configure the FPGA, apply test vectors, receive the response and diagnosis and locate the faults. The entire system is fully automated, no need of human intervention. The advantage of this system is easy to implement and has not much requirements in hardware. Based on the test system, this paper proposes a method of boundary scan and readback for the embedded BRAM in VirtexⅡ. This method firstly uses the readback method into the FPGA testing, which open a new filed in FPGA testing, therefore it has great significance.
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