CAO Wei-an, BAI Guo-qiang. A Testing System for Application Specific Integrated Circuit of Information Security[J]. Microelectronics & Computer, 2013, 30(1): 148-152.
Citation: CAO Wei-an, BAI Guo-qiang. A Testing System for Application Specific Integrated Circuit of Information Security[J]. Microelectronics & Computer, 2013, 30(1): 148-152.

A Testing System for Application Specific Integrated Circuit of Information Security

  • This paper presents a test and verification system which specially tests the function and property of information security ASIC,for that input and output data of such circuits often have large width and the test can not cover all cases.The system based on PC is implemented by cooperation of PCI software,FPGA and other hardware in order to meet tested chip's demand of high-speed transmission of large amounts of data.The test of an elliptic curve cryptography ASIC proves that the system has low cost,universal code,easy debugging,easy presenting and easy transplanting features.It also has important value to solve the problem of information security ASIC testing.
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