A New Embryonic Digital Circuit Fault Detection Method Based on LUT and Dual Modular Redundancy

In this paper, the basic characteristics of the digital circuit fault are studied, combining the demands of circuit on the fault detection, a new method based on LUT and dual modular redundancy is proposed.Using the LUT to storage the normal state of working cell, comparing the normal output of working cell and the actual output of working cell, to realize the real-time detection of the working cell, to detect whether the working cell is failure or not.This method can simultaneously test multiple cells, reducing the complexity of the circuit system and the consumption of hardware resources, which has great engineering application value.