A Screening method for single particle fault injection experimental set for SRAM-FPGA

In view of the inefficiency caused by the blind fault injection in the traditional single-particle fault injection experiment, which consumes a lot of time and manpower and is difficult to apply in practical engineering projects. This paper proposes a screening methodology for SRAM-based FPGA fault injection experiment set to guide single-particle fault injection. This methodology analyzes the SRAM FPGA chip structure, summarizes the time characteristics of single-particle faults, and determines single particle failure mode. The method of screening and prioritizing the fault injection experiment set is given in combination with the resource occupation, resource characteristics, and resource connection relationship of the specific FPGA design. A single-particle fault injection prototype system is constructed to verify the proposed method. The results show that the proposed method is correct and effective, which can quickly locate the function-related configuration bits in the design, shorten the time cost of fault injection, and make the fault injection method widely applicable to practical engineering.