Anti-EMI Design and Test Scheme for Automotive MCU

Proposing some effective methods for electromagnetic capability of Automotive MCU,including clock and IO port design.According to conducted emissions test of IEC 61967——1Ω/150Ω direct coupling method for electromagnetic interference,a test suitable for Automotive MCU is done in the paper.From analysis result of sample data,electromagnetic interference of chip level has close relationship with clock,characteristics of function module and operation mode.