TAN En-min, ZHAN Yan. Optimization of BIST Test Vectors with Pre-determined Distance[J]. Microelectronics & Computer, 2011, 28(9): 43-46.
Citation: TAN En-min, ZHAN Yan. Optimization of BIST Test Vectors with Pre-determined Distance[J]. Microelectronics & Computer, 2011, 28(9): 43-46.

Optimization of BIST Test Vectors with Pre-determined Distance

  • To analyze both hamming distance and cartesian distance, by improved the test sequences' relevance by the classical cellular automate (CA), optimization of BIST test vectors with pre-determined distance is proposed.The method through achieving maximum of the Hamming distance and pre-setting Cartesian distance to generate pre-determined distance test sequences, then gaining the best pre-determined test sequences by the global optimization operation of genetic algorithm.The results of ISCSA'85 experiment indicates that, the pre-determined test vectors generated by this testing method has higher fault coverage ratio and test efficiency than LFSR-CA structure, which makes the method in testing is more effective in testing hard-detected faults.
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