SHI Wei, YUAN Liang, XIE Shuang-jian, MAN Meng-hua. Research on Selective Redundancy of Evolved Circuits Using Negative Correlation[J]. Microelectronics & Computer, 2013, 30(6): 71-74,79.
Citation: SHI Wei, YUAN Liang, XIE Shuang-jian, MAN Meng-hua. Research on Selective Redundancy of Evolved Circuits Using Negative Correlation[J]. Microelectronics & Computer, 2013, 30(6): 71-74,79.

Research on Selective Redundancy of Evolved Circuits Using Negative Correlation

  • A new design method of selective redundancy of evolved circuits is proposed,using negative correlation to improve the fault tolerance of redundant circuits.It is a point that we combine the meansure of fitness with the simulated fault-injection making the circuits more robustness to the defined fault.Evolution is able to create sets of different circuits that when combined into an ensemble of circuits which the correlation between them is lower.The design method is proof-tested by 2×2 multiplier,though the test of fault-inject,two conclusions are obtained.The first is that the different structures are more reliable the same structures.The second is that different structures using negative correlation have more satisfactory fault tolerance than those which are selected randomly.The above results show that the reliability and validity of the design method.
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