The Design of Wrapper and Fault Test For SoC Mememory

In the testing of system on chips(SoC),the reliability testing for the memory is very important.The IEEE Std 1500 is a international standard that is specially instituted for embedded core testing,it establishes the standard interface between the providers and users of the IP cores.The design for the Wrapper architecture and controller of the SoC memory is based on the IEEE Std 1500.This paper validates the SRAM as the test object.And the results indicate that the system can diagnose the faults in the memory accurately.