Test Circuit of Pulse Width Measurement and Self-Test for Single-Event Transient

A scheme for on-chip measuring pulse width of single-event transient (SET) has been implemented in our350 nm silicon-on-insulator technology in order to research the characteristics of SET in combinational circuit.A pulse measurement circuit basing on autonomous detection technology is designed.A pulse generation circuit that used for chip self-tests and verification is proposed.The simulation results indicate the availability of this scheme,and provide some references for other deep sub-micron processes.