ZHANG Jun-bin, CAI Jin-yan, MENG Ya-feng, XU Jie, SUN Ye-zun. Design of the Fault Self-repair Circuit System Based on Evolvable Hardware and Dual Hot-backup Technique[J]. Microelectronics & Computer, 2016, 33(5): 124-126, 132.
Citation: ZHANG Jun-bin, CAI Jin-yan, MENG Ya-feng, XU Jie, SUN Ye-zun. Design of the Fault Self-repair Circuit System Based on Evolvable Hardware and Dual Hot-backup Technique[J]. Microelectronics & Computer, 2016, 33(5): 124-126, 132.

Design of the Fault Self-repair Circuit System Based on Evolvable Hardware and Dual Hot-backup Technique

  • In this paper, the circuit system design based on Evolvable Hardware (EHW) and dual hot-backup technique was proposed. It made full use of the advantages of EHW. Both the reliability of traditional redundant fault-tolerant and hardware resource consumption was considered. The universal circuit model based on EHW and dual hot-backup technique was designed. The flow of fault self-repair was analyzed in detail. The fault self-repair circuit system design can be guided by it. It will have important engineering application value.
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