A New SET-Tolerant Radiation-Hardened DLL Design with Lock Detector

This paper presents a new radiation-hardened by design DLL in 65 nm CMOS fabrication process.The proposed DLL uses a lock detector to avoid the lock error and phase error in SET (Single-event Transient) response.The simulation results demonstrate that the proposed DLL can generate quadrature phase clock in a 500 MHz with high reliability and the SET threshold is better than 100 MeV·cm²/mg, has great stability in space.