WANG Yue-ling, XUE Hai-wei, GUO gang, LEI Zhi-jun, SHI Shu-ting, LIU Jian-cheng. An Experimental Method for Evaluating the SEU of Radiation-Hardened DSP[J]. Microelectronics & Computer, 2018, 35(10): 53-57.
Citation: WANG Yue-ling, XUE Hai-wei, GUO gang, LEI Zhi-jun, SHI Shu-ting, LIU Jian-cheng. An Experimental Method for Evaluating the SEU of Radiation-Hardened DSP[J]. Microelectronics & Computer, 2018, 35(10): 53-57.

An Experimental Method for Evaluating the SEU of Radiation-Hardened DSP

  • This paper presents a new experimental method to evaluate the SEU performance of radiation-hardened DSP. The method includes three ways of solely detecting SRAM, detecting regs by CPU and function-detecting. Software and hardware detection systems are designed by the method, and SEU experimental test was done on HI-13 heavy-ion accelerator. The results show that the error rate of DSP is about 1.8E-12 error/bit·day(GEO) under irradiation dose of 1.0E+7 icons/cm2, which means the experimental method can be used for well evaluating the SEU performance of DSP.
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