A Fault Test and Diagnosis Method of FPGA Configurable-Logic-Blocks Based on Scan Chain

This paper presents a configurable scan-chain design in FPGA and a test method for Configurable Logic Blocks(CLB) based on scan chain.The proposed scan-chain design can test multiple register faults by configure the register in scan chain.The test method based on scan-chain can test all CLBs in parallel and diagnose fault CLB during fault test process,so it reduces the configuration numbers need for fault test and diagnosis.Compare with the other methods the proposed method can reduce test configuration times more than 50% and diagnosis fault CLB in test process.