YANG Ke, YAN Xue-long. Star-2 Scanning Format Research Based on IEEE 1149.7 Standard[J]. Microelectronics & Computer, 2015, 32(10): 147-150. DOI: 10.19304/j.cnki.issn1000-7180.2015.10.031
Citation: YANG Ke, YAN Xue-long. Star-2 Scanning Format Research Based on IEEE 1149.7 Standard[J]. Microelectronics & Computer, 2015, 32(10): 147-150. DOI: 10.19304/j.cnki.issn1000-7180.2015.10.031

Star-2 Scanning Format Research Based on IEEE 1149.7 Standard

  • On account of the integration of modern test system is becoming more and more complex, the IEEE 1149.7 Standard puts forwards the test method of star-2 scan topology to meet the needs of using fewer pins to achieve boundary scan at present. On the basis of on the IEEE 1149.7 standard and in-depth study on the standard, the platform of Quartus II was used to design the star-2 scanning controller, which is validated by simulation. The results indicate that the test signal can be generated by the controller, which can meet the provisions of star-2 scanning signal of IEEE 1149.7 standard and the specified Mscan format and Oscan format.
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