Abstract: FinFET as the most advanced transistor technology, has been widely used in embedded memory. However, the new process also brings new defects. Synopsys found through fault modeling and testing that FinFET memory is more sensitive to dynamic faults than planar memory. The classic test algorithm is only for static faults. At present, there are few test algorithms for dynamic faults, and the complexity is very high. Therefore, an improved dynamic fault test algorithm is proposed in this paper. This algorithm can cover all single-cell dynamic faults in two successive sensitization operations.