Abstract: There are Single event effects in the Aerospace devices working in the space environment.It shows that the high temperature could improve the sensitivity of the Aerospace devices according to the study,In order to better evaluate the radiation tolerance property of the device,it is necessary to establish a set of high-temperature single event effects test system.In this paper we establish a high-temperature single event effects test system and select ASIC device and SRAM device to perform single event effects test under high temperature,finally we find that high-temperature could improve the SEE sensitivity.