杨轲, 颜学龙. IEEE 1149.7标准两线星型扫描格式研究[J]. 微电子学与计算机, 2015, 32(10): 147-150. DOI: 10.19304/j.cnki.issn1000-7180.2015.10.031
引用本文: 杨轲, 颜学龙. IEEE 1149.7标准两线星型扫描格式研究[J]. 微电子学与计算机, 2015, 32(10): 147-150. DOI: 10.19304/j.cnki.issn1000-7180.2015.10.031
YANG Ke, YAN Xue-long. Star-2 Scanning Format Research Based on IEEE 1149.7 Standard[J]. Microelectronics & Computer, 2015, 32(10): 147-150. DOI: 10.19304/j.cnki.issn1000-7180.2015.10.031
Citation: YANG Ke, YAN Xue-long. Star-2 Scanning Format Research Based on IEEE 1149.7 Standard[J]. Microelectronics & Computer, 2015, 32(10): 147-150. DOI: 10.19304/j.cnki.issn1000-7180.2015.10.031

IEEE 1149.7标准两线星型扫描格式研究

Star-2 Scanning Format Research Based on IEEE 1149.7 Standard

  • 摘要: 针对目前现代测试系统集成度越来越高,IEEE 1149.7标准提出了两线星型扫描拓扑的测试方法以满足需要较少的引脚来实现边界扫描的现状.以IEEE 1149.7标准为依据,在深入研究该标准的基础上,利用Quartus II仿真开发平台设计了基于该标准的两线星型扫描控制器,并进行了仿真验证.结果表明测试控制器能够产生符合标准要求的Mscan扫描格式及Oscan扫描格式两线星型扫描测试信号.

     

    Abstract: On account of the integration of modern test system is becoming more and more complex, the IEEE 1149.7 Standard puts forwards the test method of star-2 scan topology to meet the needs of using fewer pins to achieve boundary scan at present. On the basis of on the IEEE 1149.7 standard and in-depth study on the standard, the platform of Quartus II was used to design the star-2 scanning controller, which is validated by simulation. The results indicate that the test signal can be generated by the controller, which can meet the provisions of star-2 scanning signal of IEEE 1149.7 standard and the specified Mscan format and Oscan format.

     

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