乌勒, 刘武, 洪亮. 基于SONOS型嵌入式flash存储器的扰动失效测试算法研究[J]. 微电子学与计算机, 2021, 38(5): 7-13.
引用本文: 乌勒, 刘武, 洪亮. 基于SONOS型嵌入式flash存储器的扰动失效测试算法研究[J]. 微电子学与计算机, 2021, 38(5): 7-13.
WU Le, LIU Wu, HONG Liang. Investigation on disturbance characteristics and test algorithm of SONOS embedded flash memory[J]. Microelectronics & Computer, 2021, 38(5): 7-13.
Citation: WU Le, LIU Wu, HONG Liang. Investigation on disturbance characteristics and test algorithm of SONOS embedded flash memory[J]. Microelectronics & Computer, 2021, 38(5): 7-13.

基于SONOS型嵌入式flash存储器的扰动失效测试算法研究

Investigation on disturbance characteristics and test algorithm of SONOS embedded flash memory

  • 摘要: 目前flash扰动失效测试算法无法检测SONOS型flash存储器的全部扰动失效,特别是对读扰动失效检测的失效覆盖率低,且测试效率不高.针对这一问题,本文对March-FT测试算法进行扩展和优化,提出了一种用于检测SONOS型flash存储器的扰动失效测试算法——March-SONOS.结合算法评估系统验证,March-SONOS测试算法可检测SONOS型flash存储器的全部扰动失效,且失效覆盖率达到100%,同时算法测试效率提高55.97%.

     

    Abstract: The current Flash disturbance failure test algorithm cannot detect all the disturbance failures of SONOS-type Flash memory, especially the failure coverage of read disturbance failure test is low, and the test efficiency is poor. To solve this problem, this paper extends and optimises the March-FT test algorithm, and put forward the March-SONOS test algorithm, which is used to detect the disturbance failure test algorithm of SONOS-type Flash memory.Combined with the verification of the algorithm evaluation system, the March_SONOS test algorithm can detect all disturbance failures of SONOS-style Flash memory, and the failure coverage rate reaches 100%. Meanwhile, the algorithm test and test efficiency is improved by 55.97%.

     

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