Abstract: Flash memory rapidly development benefits from the progress of portable devices, while pFlash has been widely used due to the low programming voltage, low power consumption and the ability to effectively suppress the band-to-band tunneling effect. Since reliability and cost are two key indicators to measure the performance of all memory and guarantee its fault coverage. The algorithm can locate pFlash fault by changing the test vectors and write mode. Compared with March-like algorithm, the test efficiency is improved by 33% and the fault coverage is still 100%. This algorithm is used to develop pFlash Built-in Self Test circuit (BIST), which can reduce its hardware overhead and reduce test time for the test machine.