Abstract: In recent years, as a IP integration method of complex System-on-chip, Network-on-chip (NoC) based on communication has gradually been known and accepted,so that became the hotspot of integrated circuit research. Not only the study of NoC technology, but also the researches on its test methods are crucial. This paper presents a parallel scheme of testing NoC router, which is designing a shared Build-In Self Test (BIST) controller to replace the special testing module, using improved multicast routing algorithm for transmitting test packets concurrently, adding the excitation circuit and the response analysis circuit to the circuit to be tested, and reusing NoC resources as test access mechanism to complete the parallel test for saving test cost. Though ecause test process and data transmission are executed in parallel, the scheme reduces the testing time. By improving testing algorithm,the fault coverage is improved, and fault location is realized. Experiments verified the validity of the test strategy.