周靖宇, 田书林, 王厚军, 龙兵. 采用电压特征的模拟电路单元件预测方法研究[J]. 微电子学与计算机, 2015, 32(12): 44-48,53.
引用本文: 周靖宇, 田书林, 王厚军, 龙兵. 采用电压特征的模拟电路单元件预测方法研究[J]. 微电子学与计算机, 2015, 32(12): 44-48,53.
ZHOU Jing-yu, TIAN Shu-lin, WANG Hou-jun, LONG Bing. An Original Prognostic Method for Single Component of Analog Circuit with Voltage Features[J]. Microelectronics & Computer, 2015, 32(12): 44-48,53.
Citation: ZHOU Jing-yu, TIAN Shu-lin, WANG Hou-jun, LONG Bing. An Original Prognostic Method for Single Component of Analog Circuit with Voltage Features[J]. Microelectronics & Computer, 2015, 32(12): 44-48,53.

采用电压特征的模拟电路单元件预测方法研究

An Original Prognostic Method for Single Component of Analog Circuit with Voltage Features

  • 摘要: 为了更好地进行模拟电路单元件剩余使用寿命的预测,提出一种采用电压特征的模拟电路单元件预测方法.该方法首先提出一种通过欧式距离和双测点电压斜率模型得到故障指示值的计算式,然后根据此式建立的退化模型得到的拟合曲线,提出了一种适用于粒子滤波的参数更新式.根据这两个式子计算故障指示值,然后通过粒子滤波进行参数更新,从而预测单元件的剩余使用性能寿命.实验结果表明该方法的性能更好.

     

    Abstract: In order to improve the performance of prognostic method for single component of analog circuit, an original prognostic method for single component of analog circuit with voltage features is proposed in this paper. Firstly, a novel formula to calculate fault indicator through Euclidean distance and two test points voltage based slope model is proposed, and according to this formula, a formula to parameter updating through particle filter is get. Secondly, according to these two formulas, the remaining useful life of single-component can be predicted through fault indicator calculation and parameter updating of particle filter proposed in this paper. And finally, the improvement of performance is confirmed in experiments.

     

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