侯斌, 莫亭亭. 用于16 bit SAR ADC的高精度比较器的设计[J]. 微电子学与计算机, 2016, 33(7): 15-18, 23.
引用本文: 侯斌, 莫亭亭. 用于16 bit SAR ADC的高精度比较器的设计[J]. 微电子学与计算机, 2016, 33(7): 15-18, 23.
HOU Bin, MO Ting-ting. Design of High Resolution Comparator for 16 Bit SAR ADC[J]. Microelectronics & Computer, 2016, 33(7): 15-18, 23.
Citation: HOU Bin, MO Ting-ting. Design of High Resolution Comparator for 16 Bit SAR ADC[J]. Microelectronics & Computer, 2016, 33(7): 15-18, 23.

用于16 bit SAR ADC的高精度比较器的设计

Design of High Resolution Comparator for 16 Bit SAR ADC

  • 摘要: 设计了一款可用于16 bit精度, 1 MS/s采样率逐次逼近型模数转换器(SAR ADC)的高精度比较器.为了实现高精度, 整个比较器使用了五级预防大器与可再生锁存器, 并采用输出失调存储(OOS)的失调电压消除方法, 有效降低比较器的失调电压.在16 bit精度下, 噪声也成为一个会影响精度的关键因素, 设计中采用了一种新型的预放大器带宽优化方法对RMS噪声和比较器功耗进行优化.在TSMC 0.18 μm工艺下, 在Cadence Spectre环境下的仿真结果表明, 该比较器在3.4 mW的功耗下实现输入失调电压标准差5.8 μV, RMS噪声16 μV, 满足16 bit SAR ADC的精度要求.

     

    Abstract: This paper presents a low noise low offset comparator used in a 1 MSPS 16 bit successive approximation register analog to digital converter (SAR ADC). The comparator is composed of five stages preamplifier and a regenerative latch. The output offset storage technique is used to further reduce offset voltage. In the design of 16bit SAR ADC, RMS noise becomes another key factor restricting the resolution. A novel bandwidth optimization method for preamplifier stages is used to achieve lower noise and lower power consumption. Implemented in TSMC 0.18 μm CMOS technology and simulated in Cadence Spectre, the proposed comparator achieves low RMS noise of 16 μV and low offset standard deviation of 5.8 μV with 3.4 mW power consumption, satisfying the stringent requirement of 16 bit SAR ADC.

     

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