于雨情, 王天琦, 齐春华, 肖立伊, 喻沛孚. 65 nm近阈值SRAM稳定性分析[J]. 微电子学与计算机, 2017, 34(1): 26-29, 34.
引用本文: 于雨情, 王天琦, 齐春华, 肖立伊, 喻沛孚. 65 nm近阈值SRAM稳定性分析[J]. 微电子学与计算机, 2017, 34(1): 26-29, 34.
YU Yu-qing, WANG Tian-qi, QI Chun-hua, XIAO Li-yi, YU Pei-fu. The Analysis of the Stability of 65 nm SRAM at Near Threshold Region[J]. Microelectronics & Computer, 2017, 34(1): 26-29, 34.
Citation: YU Yu-qing, WANG Tian-qi, QI Chun-hua, XIAO Li-yi, YU Pei-fu. The Analysis of the Stability of 65 nm SRAM at Near Threshold Region[J]. Microelectronics & Computer, 2017, 34(1): 26-29, 34.

65 nm近阈值SRAM稳定性分析

The Analysis of the Stability of 65 nm SRAM at Near Threshold Region

  • 摘要: 本文通过将供电电压降低到近阈值区域实现低功耗的目的.现有标准6T-SRAM在近阈值电压下的性能非常差, 且受工艺波动的影响很大.因此, 本文提出了一种新型的8T-SRAM, 与近阈值电压下的6管单元相比, 其静态功耗基本相同, 读噪声容限也增加了一倍.因此使该新型8管单元在实现低功耗的基础上保证了读写的稳定性.另外针对工艺波动对读噪声容限的影响进行分析, 与6T-SRAM相比, 新型8T-SRAM受工艺波动的影响更小.

     

    Abstract: Reducing the supply voltage to the near threshold region is one method to reduce the power consumption. However, operating in this region the performance of 6T-SRAM is very poor, and more sensitive to the process variation. In this paper, we introduce a novel 8T-SRAM, when compared to the standard 6T-SRAM, they have the equal static power consumption, and its read noise margin has doubled. So this 8T-SRAM not only has low power consumption, but also has high stability. Further, the impact of process variation on the read noise margin has been analysed, when compared to 6T-SRAM, 8T-SRAM is not sensitive to process variation.

     

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