马金龙, 卢礼兵. 基于反熔丝的FPGA的测试方法[J]. 微电子学与计算机, 2016, 33(8): 168-172.
引用本文: 马金龙, 卢礼兵. 基于反熔丝的FPGA的测试方法[J]. 微电子学与计算机, 2016, 33(8): 168-172.
MA Jin-long, LU Li-bing. Test Methods for Antifuse-Based FPGAs[J]. Microelectronics & Computer, 2016, 33(8): 168-172.
Citation: MA Jin-long, LU Li-bing. Test Methods for Antifuse-Based FPGAs[J]. Microelectronics & Computer, 2016, 33(8): 168-172.

基于反熔丝的FPGA的测试方法

Test Methods for Antifuse-Based FPGAs

  • 摘要: 首先介绍了基于反熔丝的FPGA的典型结构, 接着介绍了基于反熔丝的FPGA的可编程逻辑模块(PLM)、布局布线以及可编程互连资源, 然后讨论了基于反熔丝的FPGA的测试模式, 最后提出了一种ATE和实装板相结合的测试方法, 实验结果表明, 该测试方法在芯片未编程状态下, 实现了对基于反熔丝的FPGA的测试.

     

    Abstract: The classic architecture of antifuse-based FPGAs was described. Then the details about programmable logic module (PLM), placement and routing, programmable interconnection of antifuse-based FPGAs was presented. According to the test patterns of antifuse-based FPGA, a method for antifuse-based FPGA test, which combined ATE and mounting plate, was proposed. The results of the test experiments showed that the employed method can achieve successful test and confirmation of unprogrammed device at the factory.

     

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