Abstract: Single event upset is something when high energy particles hit the semiconductor device, it will cause the '1''0' transformation, and cause errors. In the harsh environment such as outer space, the chip will always be destroyed by SEU, the probability of this situation is higher since the larger scale of high performance of DSP. In view of SEU principle, anti radiation DSP will adopt a variety of reinforcement schemes. This article is based on the domestic high performance DSP 'HunXIn' architecture, from the perspective of testability and engineering, puts forward the scheme of SRAM reinforcement on chip. Through the self-refresh and trip modular redundancy technology, SEU can be effectively suppressed.