张玺, 王颀, 童炜, 霍宗亮. 一种用于三维闪存测试的低成本PMU电路[J]. 微电子学与计算机, 2020, 37(5): 1-5.
引用本文: 张玺, 王颀, 童炜, 霍宗亮. 一种用于三维闪存测试的低成本PMU电路[J]. 微电子学与计算机, 2020, 37(5): 1-5.
ZHANG Xi, WANG Xin, TONG Wei, HUO Zong-liang. A low-cost PMU circuit for 3D NAND Flash memory testing[J]. Microelectronics & Computer, 2020, 37(5): 1-5.
Citation: ZHANG Xi, WANG Xin, TONG Wei, HUO Zong-liang. A low-cost PMU circuit for 3D NAND Flash memory testing[J]. Microelectronics & Computer, 2020, 37(5): 1-5.

一种用于三维闪存测试的低成本PMU电路

A low-cost PMU circuit for 3D NAND Flash memory testing

  • 摘要: 为了改善3D NAND测试机价格昂贵导致的闪存芯片成本过高的问题,提出了一种新的基于FPGA的用于3D NAND闪存芯片直流参数测试的低成本PMU(精密测量单元)电路.利用FPGA灵活的可编程特性,通过对ADC、DAC和继电器等分立元件工作的控制,实现了具有FVMI(加电压测电流)、FIMV(加电流测电压)等直流参数测试功能的PMU电路.该PMU电路已应用于YMTC自研3D NAND Flash测试平台,可以对3D NAND的直流参数进行准确测量,并且测试机台的成本只有大型ATE机台的0.175%,从而缓解了芯片测试成本过高的问题.

     

    Abstract: In order to improve the cost of the chip caused by the high price of the 3D NAND tester, a new FPGA-based low-cost PMU (precision measurement unit) circuit for DC parameter testing of 3D NAND memory chips is proposed. The flexible programmable feature of the FPGA is used to implement the PMU circuit by controlling the discrete components of the ADC, DAC and relays so that the PMU circuit can test DC parameters with FVMI (Force Voltage Measure Current) and FIMV (Force Current Measure Voltage) function. The PMU circuit has been applied to the YMTC self-developed 3D NAND Flash test platform, which can accurately measure the DC parameters of the 3D NAND, and the cost of the test machine is only 0.175% of the cost of the large ATE machine, thus alleviating the problem of excessive test cost of the chip.

     

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