刘沛霖, 刘美容, 何怡刚, 赵睿. 基于改进的VMD和SVM的模拟电路故障诊断方法的研究[J]. 微电子学与计算机, 2022, 39(11): 85-94. DOI: 10.19304/J.ISSN1000-7180.2022.0167
引用本文: 刘沛霖, 刘美容, 何怡刚, 赵睿. 基于改进的VMD和SVM的模拟电路故障诊断方法的研究[J]. 微电子学与计算机, 2022, 39(11): 85-94. DOI: 10.19304/J.ISSN1000-7180.2022.0167
LIU Peilin, LIU Meirong, HE Yigang, ZHAO Rui. Research on fault diagnosis method of analog circuit based on improved VMD and SVM[J]. Microelectronics & Computer, 2022, 39(11): 85-94. DOI: 10.19304/J.ISSN1000-7180.2022.0167
Citation: LIU Peilin, LIU Meirong, HE Yigang, ZHAO Rui. Research on fault diagnosis method of analog circuit based on improved VMD and SVM[J]. Microelectronics & Computer, 2022, 39(11): 85-94. DOI: 10.19304/J.ISSN1000-7180.2022.0167

基于改进的VMD和SVM的模拟电路故障诊断方法的研究

Research on fault diagnosis method of analog circuit based on improved VMD and SVM

  • 摘要: 随着模拟电路的集成度和复杂度越来越高,提取其响应的特征信息也变得愈加困难.为解决提取故障信息的难题,提出将变分模态分解(variational modal decomposition,VMD)和复合多尺度排列熵(compound multi-scale permutation entropy,CMPE)相结合的算法构建故障特征向量,并且依靠麻雀搜索算法优化支持向量机(sparrow search algorithm-support vector machine,SSA-SVM)完成故障的分类。首先,通过PSPICE软件采集故障时的原始信号,并被VMD处理成多组含有原始信号特征的本征模态函数(intrinsic mode function,IMF)分量. 其次,计算出前3个IMF分量的CMPE值,归一化处理后作为故障特征向量.最后,在分类器中训练和测试.仿真测试显示本方案最终诊断正确率可达99.67%,对比其它方案能够有效提高故障诊断效率,是一种可行的模拟电路故障诊断思路.

     

    Abstract: The integration and complexity of analog circuits are getting higher and higher, and it is becoming more and more difficult to extract the characteristic information of its response. In order to solve the problem of extracting fault information, an algorithm combining variational modal decomposition (VMD) and compound multi-scale permutation entropy (CMPE) is proposed to construct a fault feature vector, and the support vector machine (SSA-SVM) optimized by the sparrow search algorithm is used to complete the fault classification. Firstly, the original signal at the time of failure is collected by the PSPICE software, and processed by VMD into multiple groups of IMF components containing the original signal characteristics. Secondly, the CMPE values of the first 3 IMF components are calculated, and the normalized processing is used as the fault feature vector. Finally, in the classification In-device training and testing. The simulation test shows that the final diagnosis accuracy rate of this scheme can reach 99.67%. Compared with other schemes, it can effectively improve the accuracy of fault diagnosis, and it is a feasible analog circuit fault diagnosis idea.

     

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